Intermediate range order of vitreous silica studied by high energy X-ray diffraction, neutron diffraction and reverse Monte Carlo modelling

Kohara, Shinji*; Suzuya, Kentaro

Physics and Chemistry of Glasses, Vol.43C 2002, p.51 - 54, 2002/00

With the arrival of the latest generation of synchrotron sources and the introduction of advanced insertion devices, the high-energy (E 30keV) X-ray diffraction technique has become feasible, leading to new approaches in the quantitative study of the structure of disordered materials. Recently, the high-energy X-ray diffraction data have been combined with neutron diffraction data from a pulsed source to provide more detailed and reliable structural information than that hitherto available. We have developed a two-axis diffractometer for glass, liquid and amorphous materials at the SPring-8 high-energy X-ray diffraction beamline BL04B2. Furthermore, we have succeeded to analyze the intermediate-range order of a typical network forming glass, silica (SiO), by reverse Monte Carlo (RMC) modelling technique with special focused on the ring structures using both high-energy X-ray and neutron diffraction data.